Test Probes for Center of 30 mil (0.76 mm)

Test probes with centers of 30 mil (0.76 mm) and greater have been designed for applications with very small centers. In some cases, the diameters are extremely small, and the receptacles for these test probes are supplied with pre-assembled wires (AWG 30/AWG 32). The length and colour of the connection wires can be selected as required.
When these test probes are used in the test adapters, a guide plate is normally inserted in order to prevent misalignment and damage to the test probe plunger and to optimise the point of contact  accuracy.