High - Frequency Test Probes

High-frequency test probes (HF-TP) consist of sprung inner and outer conductors that are arranged coaxially to one another. This arrangement is optimal for the transmission of high-frequency signals because the electromagnetic field that is required to transport the energy is restricted to the area between the inner and outer conductors. The advantage is that electromagnetic emissions and parasitic induction are effectively suppressed. Specially matched geometric relationships and high precision in manufacture allow the transmission of high-frequency signals with low emissions and losses. For that reason the high-frequency test probes of the 7860 / 7840 series are matched to suit high-frequency systems with an impedance of 50 Ohms. In the same way the geometry and dimensions of the probe heads of the inner and outer conductors are also designed to suit the relevant test piece.
High-frequency test probes are compact, space-saving and solid. As a result they are ideally suited for economically carrying out sensitive measuring tasks involving high-frequencies. Furthermore, their  modular construction allows the inner and outer conductors to be changed.
High-frequency test probes are available both in plug-in and screw-type form for use when subjected to disturbing forces that act axially (vibration, impacts and the like). For both types there are matching receptacles that allow fast and secure installation and can be changed easily.
The high-frequency test probes have a practical connecting bush for connection to a test system, permitting quick contact creation through standardised MCX miniature plugs, and without soldering or other complicated procedures. These MCX plugs are available ready assembled with a flexible  high-frequency cable of the Multiflex type, at the end of which an SMA cable plug, for example, is connected.